Context Concentrated in the Rousset-Peynier basin (Bouches-du-Rhône), the regional production of semi-conductors demands continuous optimisation of the quality of the technologies developed and produced in manufacturing lines. Faced with the worldwide competition, the success of its competitiveness depends both on the cost price and the added value.

Objectives

The CIM PACA Characterization platform provides with means to support design, test and validation of new pre-industrial technologies which combine performance, quality, efficiency and reliability at the highest level.

The essential partnership between research and industry, which will be strengthened thanks to this platform, is concerned with the development of methods and tools for the physico-chemical and electrical characterization of technologies based on non-volatile memories.

R&D themes

Physical, chemical and electrical characterization  

Failure analysis

Metrology

Ultra cleanliness

Service

The platform provides services within the areas of:    

• The physico-chemical materials    
• Analysis of component failure             

These services are offered:    

• Its contributors Members (Atmel Biophy Research, IBS, Nexcis, Presto Engineering, Probion Analysis, STMicroelectronics, Tera Environment, University Paul Cézanne)    
• Entities third non-members on request (external services)            

The facilities are operated by specialists seconded to the platform by members, which allows for the facilities (including provision of a detailed analysis report)  

The platform has been authorized under the Research Tax Credit (ITC): therefore, the R & D can be taken into account as part of the research tax credit          

For more information, contact:

Pascal GALAND - DirectorOffice:

tel: +33 (0) 4 42 68 88 45

Mobile: +33 (0) 6 80 53 49 83

E-mail: @ pascal.galand caracterisation.org

Equipement available and service offer

Equipment/Techniques :  

Characterization: D-SIMS, Auger, FIB, TEM, SEM, XPS, Raman, ToF-SIMS, AFM, SRP, optical microscopes, ESD test benches, very low current tester

 Failure Analysis: static and dynamic light emission microscope and thermal and photoelectrical laser stimulation bench, nano-probing

Metrology & Ultra cleanliness: UV+visible ellipsometer, slurry control, PTR-MS, ATD GC MS

Documents to download

Founder Members

LFoundry

Biophy Research

IBS

STMicroelectronics

Université Paul Cézanne (Aix-Marseille 3)

Financing

The equipment of the platform is shared by the industrials and has been cofinanced by :

F.E.D.E.R.

Associated Members and partners

Firms :  

ATMEL

Kemesys

Nexcis

Presto Engineering

Orsay Physics

Probion

Rockwood Wafer reclaim

Silios

Tera Environnement

Vegatec

Public laboratories :

CEREGE

CRHEA

CRMC-N

Institut Fresnel

L2MP

LCE

TECSEN CP2M

Location

Rousset (Bouches-du-Rhône) - France

Contact

caracterisation@arcsis.org BP 19, Place Paul Borde 13790 Rousset - France tél :+33 (0) 4 42 53 81 50 fax : +33 (0) 4 42 53 81 51

Download files

PF_Caract_risation_CIM_PACA_-_Investissements_CPA_Phase_1__PPTminimizer_.ppt 1.0 M